Cryogenic positioning and alignment with micrometer precision in a magnetic resonance force microscope-Reference-Cited by-同舟云学术

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Cryogenic positioning and alignment with micrometer precision in a magnetic resonance force microscope

Published:2018-01 Issue:1 Volume:89 Page:013707
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Isaac Corinne E.¹^ORCID,Curley Elizabeth A.¹,Nasr Paméla T.¹,Nguyen Hoang L.¹^ORCID,Marohn John A.¹^ORCID

Affiliation:

1. Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853-1301, USA

Funder

National Science Foundation

DOD | United States Army | RDECOM | Army Research Office

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5008505

Reference42 articles.

1. Attonewton force detection using ultrathin silicon cantilevers

2. Batch fabrication and characterization of ultrasensitive cantilevers with submicron magnetic tips

3. Displacement detection of silicon nanowires by polarization-enhanced fiber-optic interferometry

4. Nanomechanical detection of nuclear magnetic resonance using a silicon nanowire oscillator

5. Electron Spin Relaxation Near a Micron-Size Ferromagnet

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Non-Perturbative, Low-Noise Surface Coating for Sensitive Force-Gradient Detection of Electron Spin Resonance in Thin Films;ACS Nano;2023-01-10

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