Recent charge-breeding developments with EBIS/T devices (invited)
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4933033
Reference42 articles.
1. G. Zschornack, M. Schmidt, and A. Thorn, inCAS-CERN Accelerator School, Ion Sources, edited by R. Bailey (CERN, 2013), p. 165, CERN-2013-007.
2. Electron beam ion source and electron beam ion trap (invited)
3. External ion injection into CRYEBIS
4. The Electron Beam Ion Trap: A New Instrument for Atomic Physics Measurements
5. AIP Conference Proceedings;Lapierre A.,2015
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