A hot probe setup for the measurement of Seebeck coefficient of thin wires and thin films using integral method
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Reference16 articles.
1. Experimental setup for the measurement of the electrical resistivity and thermopower of thin films and bulk materials
2. Apparatus for Seebeck coefficient and electrical resistivity measurements of bulk thermoelectric materials at high temperature
3. Experimental set-up for thermopower and resistivity measurements at 100-1300 K
4. Sample probe to measure resistivity and thermopower in the temperature range of 300–1000K
5. Apparatus for the rapid scanning of the Seebeck coefficient of semiconductors
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