Measurement of hard x-ray lens wavefront aberrations using phase retrieval-Reference-Cited by-同舟云学术

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Measurement of hard x-ray lens wavefront aberrations using phase retrieval

Published:2011-03-14 Issue:11 Volume:98 Page:111108
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Guizar-Sicairos Manuel,Narayanan Suresh,Stein Aaron,Metzler Meredith,Sandy Alec R.,Fienup James R.,Evans-Lutterodt Kenneth

Funder

U.S. Department of Energy

National Science Foundation

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3558914

Reference14 articles.

1. Optical Shop Testing

2. X-ray active mirror coupled with a Hartmann wavefront sensor

3. X-ray wavefront analysis and optics characterization with a grating interferometer

4. Movable Aperture Lensless Transmission Microscopy: A Novel Phase Retrieval Algorithm

5. Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversity

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