Model of dielectric breakdown in hafnia-based ferroelectric capacitors-Reference-Cited by-同舟云学术

Model of dielectric breakdown in hafnia-based ferroelectric capacitors

Published:2018-07-14 Issue:2 Volume:124 Page:024103
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Xue Kan-Hao¹^ORCID,Su Hai-Lei¹,Li Yi¹^ORCID,Sun Hua-Jun¹,He Wei-Fan¹,Chang Ting-Chang²^ORCID,Chen Lin³,Zhang David Wei³,Miao Xiang-Shui¹

Affiliation:

1. Wuhan National Research Center for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China

2. Department of Physics, National Sun Yat-sen University, Kaohsiung 804, Taiwan

3. School of Microelectronics, Fudan University, Shanghai 200433, China

Funder

National Natural Science Foundation of China

Ministry of Science and Technology of the People's Republic of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5031491

Reference92 articles.

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5. Quantitative measurement of space‐charge effects in lead zirconate‐titanate memories

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