Electron diffraction studies of Ag photodoping in GexSe1−xglass films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.92034
Reference8 articles.
1. Bilevel high resolution photolithographic technique for use with wafers with stepped and/or reflecting surfaces
2. A novel inorganic photoresist utilizing Ag photodoping in Se‐Ge glass films
3. A new inorganic electron resist of high contrast
4. Study on the Amorphous Structure of Se-GeSe2 Alloys by X-ray Diffraction
5. The amorphous structure of the GeSe system
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1. Non-volatile switching characteristics in wet-deposited Ag2Se/GeSe double layers for resistive random access memory applications;Applied Physics Letters;2013-05-13
2. Morphology and structural studies of Ag photo-diffused GeySe1−y thin films prepared by RF-sputtering;Journal of Non-Crystalline Solids;2009-10
3. Heterogeneity of molecular structure of Ag photo-diffused Ge30Se70 thin films;Journal of Non-Crystalline Solids;2008-05
4. In Situ Measurements of X-Ray-Induced Silver Diffusion into a Ge30Se70Thin Film;Journal of the American Ceramic Society;2008-03
5. Ag-photodoping in Ge-chalcogenide amorphous thin films—Reaction products and their characterization;Journal of Physics and Chemistry of Solids;2007-05
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