Implementation on a desktop computer of the real time feedback control loop of a scanning probe microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2992483
Reference27 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Atomic Force Microscope
3. Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope
4. Scanning capacitance microscopy
5. Near-Field Scanning Optical Microscopy
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