In situ characterization of optical micro/nano fibers using scattering loss analysis

Abstract

We experimentally demonstrate the in situ characterization of optical micro/nano fibers (MNFs). The MNF (test fiber, TF) is positioned on a microfiber (probe fiber, PF) and simulated for the scattering loss at various PF and TF diameters. The TF is fabricated using chemical etching technique. The PF is a conventional single-mode fiber with an outer diameter of 125 μm. We measure the scattering loss along the TF axis at various positions i.e., diameters by mounting it on the PF. The diameter profile of the TF is inferred from the measured scattering loss and correlated with its surface morphology measurement. This work demonstrates an effective, low-cost, and non-destructive method for in situ characterization of fabricated MNFs. It can detect and determine the irregularities on the surface of OMNFs. It can also be used to quantify the local evanescent field. Detecting such local points can improve studies that are carried out using these fields in various sensing and related study domains. It is simple to implement and can be accessed by all domains of researchers.