An ultrafast programmable electrical tester for enabling time-resolved, sub-nanosecond switching dynamics and programming of nanoscale memory devices
Author:
Affiliation:
1. Discipline of Electrical Engineering, Indian Institute of Technology Indore, Indore 453552, India
2. Metallurgy Engineering and Materials Science, Indian Institute of Technology Indore, Indore 453552, India
Funder
DST | Science and Engineering Research Board
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4999522
Reference23 articles.
1. Reversible Electrical Switching Phenomena in Disordered Structures
2. Towards a universal memory?
3. Phase-change materials for rewriteable data storage
4. Threshold switching in chalcogenide‐glass thin films
5. An optoelectronic framework enabled by low-dimensional phase-change films
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1. Time-Domain Analysis of Chalcogenide Threshold Switching: From ns to ps Scale;Frontiers in Physics;2022-04-06
2. A scheme for enabling the ultimate speed of threshold switching in phase change memory devices;Scientific Reports;2021-03-17
3. Rapid threshold switching dynamics of co-sputtered chalcogenide Ge15Te85 device for selector application;Semiconductor Science and Technology;2020-11-18
4. Exploring ultrafast threshold switching in In3SbTe2 phase change memory devices;Scientific Reports;2019-12
5. Sub-nanosecond threshold switching dynamics in GeSb2Te4 phase change memory device;Journal of Physics D: Applied Physics;2019-10-25
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