A field ionizer for photodetachment studies of negative ions

Author:

Welander J.1ORCID,Navarro Navarrete J. E.1,Rohlén J.1,Leopold T.1,Thomas R. D.2ORCID,Pegg D. J.3,Hanstorp D.1ORCID

Affiliation:

1. Department of Physics, University of Gothenburg, SE-412 96 Gothenburg, Sweden

2. Department of Physics, AlbaNova, Stockholm University, SE-106 91 Stockholm, Sweden

3. Department of Physics, University of Tennessee, Knoxville, Tennessee 37996, USA

Abstract

In this paper, we present an apparatus for studies into the photodetachment process of atomic negative ions. State-selective detection of the residual atom following the initial photodetachment step is achieved by combining resonant laser excitation of the photo-detached atom with electric field ionization. The resonance ionization technique in combination with a co-linear ion–laser beam geometry gives an experimental apparatus that has both high selectivity and sensitivity. In addition to measurements of a single selected partial photodetachment channel, the apparatus also can be used to study a manifold of photodetachment channels in which the residual atom is left in a high-lying Rydberg state and for investigation of the double electron-detachment process. Ion-optical simulations in SIMION are used to illustrate the operation of the apparatus for studying such processes. Successful performance of the apparatus against the simulation is demonstrated by a high resolution study of the photodetachment of cesium, where the sharp s-wave threshold of the photodetachment processes leaving the residual atom in the excited 6 p state was investigated.

Funder

Vetenskapsrådet

Publisher

AIP Publishing

Subject

Instrumentation

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