Characterization of tips for conducting atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145649
Reference16 articles.
1. Direct measurement of forces during scanning tunneling microscope imaging of graphite
2. Combined scanning tunneling and force microscopy
3. Observation of metallic adhesion using the scanning tunneling microscope
4. Scanning force/tunneling microscopy of a graphite surface in air
5. Tip-surface forces during imaging by scanning tunneling microscopy
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