Measurements of emissivity and temperature for polarized long-wavelength infrared light from tungsten under simulating tokamak conditions

Abstract

Tungsten is regarded as the baseline first wall material in tokamaks. This work provides a polarized method for measuring the emissivity and temperature of the tungsten using an infrared camera and a polarizer under simulating tokamak conditions. In the experiment, a polarizer with an adjustable polarization direction is set up in front of an infrared camera. A rotatable fixture is used to fix the sample and change the angle between the surface and the normal. The sample is rotated from 0° to 80°, and the polarized emissivity first increases and then decreases with increasing rotation angle. The uncertainty in emissivity resulting from this polarized method and non-polarized method is analyzed. To compare the effects of the polarized method and the non-polarized method, the rotation angle is adjusted to 0°, and a fitting model is used to describe the relationship between emissivity and temperature. Errors between the calculated temperature and measured temperature are used as a scale, and the polarized method improves the accuracy of temperature measurement. This polarized method provides a technical way to measure the emissivity and temperature in a tokamak and can be applied in other similar applications.