Failure mechanism analysis of electromigration dominated damage in TiSi2 nanowires
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3151965
Reference18 articles.
1. Creep flow, diffusion, and electromigration in small scale interconnects
2. First-Principle Study on the Reactions and Dynamical Electronic Characteristics of Electromigration on Aluminum Nanowires
3. Fabrication of metallic electrodes with nanometer separation by electromigration
4. Clean Electromigrated Nanogaps Imaged by Transmission Electron Microscopy
5. Electromigration in Gold and Single Crystalline Silver Nanowires
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1. Process optimization of titanium self-aligned silicide formation through evaluation of sheet resistance by design of experiment methodology;Solid-State Electronics;2024-05
2. Critical temperature in feedback-controlled electromigration of gold nanostructures;Nanotechnology;2018-10-26
3. Imaging current paths in complex conductors by scanning fluorescence microscopy;Applied Physics Letters;2012-09-17
4. Reduced Joule heating in nanowires;Applied Physics Letters;2011-03-07
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