Properties of a dielectric probe for scanning near-field millimeter-wave microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2174110
Reference11 articles.
1. 7 × 7 Reconstruction on Si(111) Resolved in Real Space
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1. Experimental demonstration of an ultra-broadband subwavelength resolution probe from microwave to terahertz regime;Optics Letters;2018-07-25
2. Broad-Band Dielectric Probes for On-Wafer Characterization of Terahertz Devices;2018 IEEE 68th Electronic Components and Technology Conference (ECTC);2018-05
3. A 60 Ghz Scanning Near-Field Microscope With High Spatial Resolution Sub-Surface Imaging;IEEE Microwave and Wireless Components Letters;2011-11
4. Review of Near-Field Terahertz Measurement Methods and Their Applications;Journal of Infrared, Millimeter, and Terahertz Waves;2011-07-28
5. Near-field wire-based passive probe antenna for the selective detection of the longitudinal electric field at terahertz frequencies;Journal of Applied Physics;2009-10
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