Optical and x-ray characterization of the Daedalus ultrafast x-ray imager

Abstract

The Daedalus ultrafast x-ray imager is the latest generation in Sandia’s hybrid CMOS detector family. With three frames along an identical line of sight, 1 ns minimum integration time, a higher full well than Icarus, and added features, Daedalus brings exciting new capabilities to diagnostic applications in inertial confinement fusion and high energy density science. In this work, we present measurements of time response, dynamic range, spatial uniformity, pixel cross-talk, and absolute x-ray sensitivity using pulsed optical and x-ray sources. We report a measured 1.5 Me− full well, pixel sensitivity at 9.58 × 10−7 V/e−, and an estimate of spatial uniformity at ∼5% across the sensor array.