Determination of the geometric corrugation of graphene on SiC(0001) by grazing incidence fast atom diffraction
Author:
Affiliation:
1. Institut des Sciences Moléculaires d'Orsay, ISMO, UMR 8214, CNRS-Univ Paris-Sud, Bât. 351, F-91405 Orsay, France
2. Université de Cergy-Pontoise, 33 Boulevard du Port, F-95031 Cergy, France
Funder
Triangle de la physique
Agence Nationale de la Recherche (L' Agence Nationale de la Recherche)
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4914178
Reference30 articles.
1. A roadmap for graphene
2. Enhancement of Chemical Activity in Corrugated Graphene
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4. The growth and morphology of epitaxial multilayer graphene
5. Electronic and geometric corrugation of periodically rippled, self-nanostructured graphene epitaxially grown on Ru(0001)
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