Structural and elastic characterization of Cu-implanted SiO2 films on Si(100) substrates
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2437690
Reference24 articles.
1. Metal nanocrystal memories. I. Device design and fabrication
2. Nanocomposites formed by ion implantation: Recent developments and future opportunities
3. Structural characterization of Cu nanocrystals formed in SiO2 by high-energy ion-beam synthesis
4. Preferred orientations of FCC metals on amorphous silica
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Monitoring of Film Qualities of Amorphous SiO2 films/Si(100) Substrates by Measuring Bulk and Surface Acoustic Waves in Terms of Brillouin Spectroscopy;Journal of the Korean Physical Society;2018-10
2. Preferred orientations in nano-gold/silica/silicon interfaces;Applied Surface Science;2010-06
3. X-ray Diffraction Spectra in Cu-Implanted SiO[sub 2] Films on Si(100) Substrates;AIP Conference Proceedings;2010
4. Effect of annealing on preferred orientations in the Cu/SiO2 and Cu/SiO2/Si(100) interfaces;Materials Science and Engineering: A;2008-04
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