Elliptical spectrograph/gated microchannel‐plate detector for time‐resolved spectral measurements in the x‐ray region
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1140073
Reference8 articles.
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3. Two‐channel, elliptical analyzer spectrograph for absolute, time‐resolving time‐integrating spectrometry of pulsed x‐ray sources in the 100–10 000‐eV region
4. Optical fiducials for x‐ray streak cameras at LLE
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Introduction to Plasma Spectroscopy;Springer Series on Atomic, Optical, and Plasma Physics;2009
2. Study on time-resolved fluorescence dynamics of cyanine dye sensitizing AgBr;Science in China Series G: Physics, Mechanics and Astronomy;2008-03
3. Design of an elliptical crystal spectrometer for diagnosing pulsed plasma x-ray;Novel Optical Systems Design and Optimization VII;2004-10-22
4. Demonstration of population inversion by resonant photopumping in a neon gas cell irradiated by a sodiumZpinch;Physical Review Letters;1992-02-10
5. Demonstration of reduced source size broadening with a Johann focusing elliptical spectrograph and theory of the second‐order source broadening;Review of Scientific Instruments;1990-07
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