Ellipsometric study of the electronic behaviors of titanium-vanadium dioxide (TixV1−xO2) films for 0 ≤ x ≤ 1 during semiconductive-to-metallic phase transition-Reference-Cited by-同舟云学术

Ellipsometric study of the electronic behaviors of titanium-vanadium dioxide (TixV1−xO2) films for 0 ≤ x ≤ 1 during semiconductive-to-metallic phase transition

Published:2021-02-22 Issue:8 Volume:118 Page:081901
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kakiuchida Hiroshi¹^ORCID,Okada Masahisa¹^ORCID,Yamada Yasusei¹^ORCID,Tazawa Masato²^ORCID

Affiliation:

1. Innovative Functional Materials Research Institute, National Institute of Advanced Industrial Science and Technology, 2266-98 Anagahora, Shimoshidami, Moriyama, Nagoya, Aichi 463-8560, Japan

2. AIST Chugoku, National Institute of Advanced Industrial Science and Technology, 3-11-32, Kagami-yama, Higashi-hiroshima, Hiroshima 739-0046, Japan

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0029279

Reference43 articles.

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5. Thermochromic fenestration with VO2-based materials: Three challenges and how they can be met

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