Observation ofpnjunctions on implanted silicon using a scanning tunneling microscope
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.99876
Reference4 articles.
1. Surface Electronic Structure of Si (111)-(7×7) Resolved in Real Space
2. Scanning tunneling microscopy and potentiometry on a semiconductor heterojunction
3. The Topografiner: An Instrument for Measuring Surface Microtopography
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