Cs+ ion microsource
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1139982
Reference19 articles.
1. Emission of Negative Ions from Metal Surfaces Bombarded by Positive Cesium Ions
2. Analytic methods for the ion microprobe mass analyzer. Part II.
3. Sputtering Mass Spectrometer with Cesium Primay Ion Source
4. A close to universal negative ion source
5. Evaluation of a cesium primary ion source on an ion microprobe mass spectrometer
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A compact 65 keV stable ion gun for radioactive beam experiments;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1996-01
2. Sources of Low-Charge-State Positive-Ion Beams1 1Research was sponsored by the U.S. Department of Energy under Contract No. DE-AC05-84OR21400 with Martin Marietta Energy Systems, Inc.;Methods in Experimental Physics;1995
3. Ion sources for accelerators in materials research;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-02
4. Yield enhancements of secondary negative molecular ions consisting of matrix elements under cesium primary ion bombardment of GaAs;Journal of Applied Physics;1992-03-15
5. Ion Probe Microscopy;Advances in Optical and Electron Microscopy;1989
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