Design and comparison of seutolerant 10T memory cell for radiation environment applications
Author:
Publisher
AIP Publishing
Link
http://aip.scitation.org/doi/pdf/10.1063/5.0199486
Reference16 articles.
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3. Upset hardened memory design for submicron CMOS technology
4. Soft-Error-Immune Read-Stability-Improved SRAM for Multi-Node Upset Tolerance in Space Applications
5. S. Pal, S. Mohapatra, W.-H. Ki, and A. Islam, “Soft-Error-Aware Read-Decoupled SRAM With Multi-Node Recovery for Aerospace Appli-cations,” IEEE Transactions on Circuits and Systems II: Express Briefs 68, 3336–3340 (2021).
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