Dynamics of direct X-ray detection processes in high-Z Bi2O3 nanoparticles-loaded PFO polymer-based diodes-Reference-Cited by-同舟云学术

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Dynamics of direct X-ray detection processes in high-Z Bi2O3 nanoparticles-loaded PFO polymer-based diodes

Published:2017-10-30 Issue:18 Volume:111 Page:183301
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Ciavatti A.¹^ORCID,Cramer T.¹,Carroli M.¹,Basiricò L.¹^ORCID,Fuhrer R.²,De Leeuw D. M.³,Fraboni B.¹

Affiliation:

1. Department of Physics and Astronomy, University of Bologna, Viale Berti Pichat 6/2, Bologna 40127, Italy

2. Avantama AG, Laubisrutistrasse 50, 8712 Stafa, Switzerland

3. Faculty of Aerospace Engineering, Delft University of Technology, Kluyverweg 1, 2629 HS Delft, The Netherlands

Funder

European Commission

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4986345

Reference18 articles.

1. Silicon carbide and its use as a radiation detector material

2. Organic Semiconducting Single Crystals as Next Generation of Low-Cost, Room-Temperature Electrical X-ray Detectors

3. Toward Low-Voltage and Bendable X-Ray Direct Detectors Based on Organic Semiconducting Single Crystals

4. Charged-particle spectroscopy in organic semiconducting single crystals

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