Photoelectron yield spectroscopy and inverse photoemission spectroscopy evaluations of p-type amorphous silicon carbide films prepared using liquid materials-Reference-Cited by-同舟云学术

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Photoelectron yield spectroscopy and inverse photoemission spectroscopy evaluations of p-type amorphous silicon carbide films prepared using liquid materials

Published:2016-05 Issue:5 Volume:6 Page:055021
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Murakami Tatsuya¹,Masuda Takashi²,Inoue Satoshi²,Yano Hiroshi³,Iwamuro Noriyuki³^ORCID,Shimoda Tatsuya²

Affiliation:

1. Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology (JAIST), 1-1 Asahidai, Nomi, Ishikawa 923-1292, Japan

2. Green Device Research Center, Japan Advanced Institute of Science and Technology, Nomi, Ishikawa 923-1211, Japan

3. Graduate School of Pure and Applied Sciences, University of Tsukuba, Tennoudai, Tsukuba, Ibaraki 305-8573, Japan

Funder

Shibuya Foundation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4952592

Reference24 articles.

1. Development of high tensile strength silicon carbide fibre using an organosilicon polymer precursor

2. Ceramics Via Polymer Pyrolysisdagger

3. Synthesis of continuous silicon carbide fibre

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Liquid Silicon Family Materials(2): SiC;Nanoliquid Processes for Electronic Devices;2019

2. Preparation and characterization of polymer-derived amorphous silicon carbide with silicon-rich stoichiometry;Thin Solid Films;2016-08

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