Examination of humidity effects on measured thickness and interfacial phenomena of exfoliated graphene on silicon dioxide via amplitude modulation atomic force microscopy-Reference-Cited by-同舟云学术

Examination of humidity effects on measured thickness and interfacial phenomena of exfoliated graphene on silicon dioxide via amplitude modulation atomic force microscopy

Published:2015-12-14 Issue:24 Volume:107 Page:243107
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Jinkins K.¹,Camacho J.²,Farina L.¹,Wu Y.¹^ORCID

Affiliation:

1. Engineering Physics Department, University of Wisconsin-Platteville, 1 University Plaza, Platteville, Wisconsin 53818, USA

2. Mechanical Engineering Department, University of Wisconsin-Platteville, 1 University Plaza, Platteville, Wisconsin 53818, USA

Funder

National Science Foundation (NSF)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4938068

Reference24 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Graphene: A Rising Star on the Horizon of Materials Science

3. Fabrication and Thermoelectric Properties of Graphene/Bi2Te3Composite Materials

4. The rise of graphene

5. The electronic properties of graphene

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