Electron Diffraction-Based Techniques for 2D Layered Materials

Abstract

Unravelling of the various crystallographic hitches of variety of nanomaterials and their bulk equivalents were accomplished through vigorous electron diffraction-based characterization techniques since the 19th century. Scanning Electron Microscopy (SEM), Energy dispersive X-Ray analysis (EDAX) and Transmission Electron Microscopy (TEM) are the salient characterization techniques that are being extensively casted-off in solid state physics and nanotechnology for the better insight assessment of the emerging low dimensional materials. Mainly, In SEM, the reflected or knocked-off electrons furnishes the comprehensive view of the surface morphology and its composition, whereas in case of TEM, the transmitted electrons hands over the information regarding the crystal structure, morphology, strain properties, phase distribution of the pigments, and its compositional elements. With all the consistencies and variances, conjointly both these electron diffraction-based techniques are exclusively utilized for a lot of advanced studies on the comprehensive interpretation and analysis which includes in-situ high resolution imaging of the modern two-dimensional materials to find out the crystal defects, bonding and various electronic and optical properties. Therefore, this chapter reviews different types of electron diffraction techniques and its physical significance, basic principle, modus operandi, instrumentation and plentiful applications along with the future outlooks.