Nickel–silicon interfacial adhesion strength measured by laser spallation

Author:

Yan XiaoORCID,Diamond Jacob M.123ORCID,Fritz Nathan J.1ORCID,Matsuo Satoshi1ORCID,Rabbi Kazi F.4ORCID,Zarin Ishrat4ORCID,Miljkovic Nenad4256ORCID,Braun Paul V.123ORCID,Sottos Nancy R.123ORCID

Affiliation:

1. Department of Materials Science and Engineering, University of Illinois Urbana-Champaign 2 , Urbana, Illinois 61801, USA

2. Materials Research Laboratory, University of Illinois Urbana-Champaign 3 , Urbana, Illinois 61801, USA

3. Beckman Institute for Advanced Science and Technology, University of Illinois Urbana-Champaign 4 , Urbana, Illinois 61801, USA

4. Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign 1 , Urbana, Illinois 61801, USA

5. Department of Electrical and Computer Engineering, University of Illinois Urbana-Champaign 5 , Urbana, Illinois 61801, USA

6. International Institute for Carbon Neutral Energy Research (WPI-I2CNER), Kyushu University 6 , 744 Moto-oka, Nishi-ku, Fukuoka 819-0395, Japan

Abstract

Thin films of amorphous silicon (a-Si) coated on metals such as nickel (Ni) are one of the most promising anode architectures for high-energy-density lithium-ion (Li-ion) batteries. The performance and longevity of batteries with this type of electrode depend on the integrity of the Ni/a–Si interface. The integrity of the a-Si /Ni bonded interface during cycling is critical, but the experimental characterization of interfacial failure of this material system is highly challenging and there is a sparsity of interface strength data in the literature. Here, we describe a laser spallation (LS) technique to characterize the interfacial adhesion strength of Ni/a–Si multilayer films created by chemical vapor deposition (CVD). The LS technique enables the non-contact measurement of the tensile interfacial strength with high precision when compared to conventional methods for characterizing adhesion. Interferometric measurement combined with finite element analysis shows that the Ni/a–Si interface, created via the CVD of a-Si on Ni surfaces can withstand ≈46–72 MPa in tension before failure initiation. To ensure successful and precise characterization of interfacial adhesion strength using LS, we further develop a design criterion for multi-layer samples by analyzing the thin-film mechanics. Our study provides insights into the strength of the Ni/a–Si interface that governs the performance and durability of high-energy-density anodes and offers design guidelines for improving thin-film electrode integrity.

Funder

Construction Engineering Research Laboratory

Office of Naval Research

International Institute for Carbon-Neutral Energy Research, Kyushu University

National Natural Science Foundation of China

Publisher

AIP Publishing

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