Unambiguous determination of crystal‐lattice strains in epitaxially grown SiGe/Si multilayers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.363793
Reference13 articles.
1. Determination of dislocation loop size and density in ion implanted and annealed silicon by simulation of triple crystal X-ray rocking curves
2. Analysis of (n,-n) and (n, -n, n) X-ray rocking curves of processed silicon
3. Fitting of rocking curves from ion-implanted semiconductors
4. Backscattering analysis of Si1−yCy layers using the 12C(4He,4He) 12C resonance at 4.265 MeV
5. Fourier Reconstruction of Density Profiles of Thin Films Using Anomalous X-Ray Reflectivity
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1. Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials;Optics Communications;2005-07
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