Analytical current–voltage relationships for electron tunneling across rough interfaces
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1866472
Reference19 articles.
1. Tunneling Through Thin Insulating Layers
2. Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current images
3. Tunneling characteristics of nonuniform ultrathin oxides
4. Numerical analysis for root-mean-square roughness of SiO2/Si interface on direct tunneling current in ultrathin MOSFETs
5. Limits of high-density, low-force pressure contacts
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