Direct observation of deep electron traps in aged organic light emitting diodes
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1835567
Reference12 articles.
1. Reliability and degradation of small molecule-based organic light-emitting devices (OLEDs)
2. Nonradiative recombination centers and electrical aging of organic light-emitting diodes: Direct connection between accumulation of trapped charge and luminance loss
3. Interfacial charges and electric field distribution in organic hetero-layer light-emitting devices
4. Influence of trapped and interfacial charges in organic multilayer light-emitting devices
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