Mapping electrostatic profiles across axial p-n junctions in Si nanowires using off-axis electron holography
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4824775
Reference24 articles.
1. Silicon Nanowires: A Review on Aspects of their Growth and their Electrical Properties
2. Nanowire Nanosensors for Highly Sensitive and Selective Detection of Biological and Chemical Species
3. Silicon Vertically Integrated Nanowire Field Effect Transistors
4. Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si
5. Study of Al thermal diffusion in ZnTe using secondary ion mass spectroscopy
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3. In situ off-axis electron holography of real-time dopant diffusion in GaAs nanowires;Nanotechnology;2022-08-31
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