The particularities of using of the hard x-rays (60 – 120 keV) of synchrotron radiation for determination the trace amounts of Rare-Earth elements by the SRXRF method

Author:

Legkodymov A. A.,Zolotarev K. V.,Kulipanov G. N.

Publisher

AIP Publishing

Reference8 articles.

1. Use of highly energetic (116 keV) synchrotron radiation for X-ray fluorescence analysis of trace rare-earth and heavy elements

2. I. Nakai, “High-energy X-ray fluorescence,” in the book X-Ray Spectrometry: Recent Technological Advances, edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken (John Wiley and Sons, Chichester, 2004), pp. 355–373.

3. Applying Hard X-rays to determination of the minimum detection levels of rare earth element by the XRFA-SR method

4. Review of X-ray fluorescent analysis using synchrotron radiation

5. V. Baryshev, G. Kulipanov and A. Skpinsky, “X-ray Fluorescent Elemental Analysis,” in Handbook on Synchrotron Radiation, edited by G. Brown and D.E. Moncton (Elsevier Science Publishers, Amsterdam, 1991), pp. 639–688.

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