Untrained deep learning-based fringe projection profilometry-Reference-Cited by-同舟云学术

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Untrained deep learning-based fringe projection profilometry

Published:2022-01-01 Issue:1 Volume:7 Page:016102
ISSN:2378-0967
Container-title:APL Photonics
language:en
Short-container-title:APL Photonics

Author:

Yu Haotian¹²,Han Bowen¹²,Bai Lianfa¹²,Zheng Dongliang¹²^ORCID,Han Jing¹²^ORCID

Affiliation:

1. School of Electronic and Optical Engineering, Nanjing University of Science and Technology, No. 200 Xiaolingwei Street, Nanjing, Jiangsu Province 210094, China

2. Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China

Funder

National Natural Science Foundation of China

Jiangsu Provincial Key Research and Development Program

Publisher

AIP Publishing

Subject

Computer Networks and Communications,Atomic and Molecular Physics, and Optics

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0069386

Reference64 articles.

1. High-speed three-dimensional shape measurement based on cyclic complementary Gray-code light

2. High-speed phase-shifting profilometry under fluorescent light

3. High dynamic range scanning technique

4. Recovering the absolute phase maps of two fringe patterns with selected frequencies

5. Modified sinusoidal fringe-pattern projection for variable illuminance in phase-shifting three-dimensional surface-shape metrology

Cited by 23 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Novel approach for fast structured light framework using deep learning;Image and Vision Computing;2024-10

2. Direct fringe projection profilometry based on the spatial frequency distribution function in optical 3D imaging;Optics & Laser Technology;2024-07

3. Deep learning in fringe projection: A review;Neurocomputing;2024-05

4. Weakly supervised phase unwrapping for single-camera fringe projection profilometry;Optics Communications;2024-04

5. Single-shot 3D Reconstruction by Fusion of Fourier Transform Profilometry and Line Clustering;IEEE Journal of Selected Topics in Signal Processing;2024-04

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