z calibration of the atomic force microscope by means of a pyramidal tip
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1143873
Reference15 articles.
1. Atomic Force Microscope
2. Atomic Resolution with Atomic Force Microscope
3. Atomic resolution imaging of a nonconductor by atomic force microscopy
4. Domain boundaries and buckling superstructures in Langmuir–Blodgett films
5. Friction measurements on phase-separated thin films with a modified atomic force microscope
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