Characterization of GaAs/Ga1−xAlxAs heterojunction bipolar transistor structures using photoreflectance
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.102536
Reference17 articles.
1. Modulation spectroscopy as a tool for electronic material characterization
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4. Electroreflectance and photoreflectance study of the space-charge region in semiconductors: (In-Sn-O)/InP as a model system
5. Piezoreflectance characterization of resonant tunneling and modulation-doped heterostructures
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