Spectroscopic ellipsometric characterization of undoped ZnTe films grown on GaAs
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.118289
Reference17 articles.
1. Numerical Derivative Analysis of the Pseudodielectric Functions of ZnTe
2. Optical properties of ZnTe
3. Chemical etching and cleaning procedures for Si, Ge, and some III‐V compound semiconductors
4. Optical properties of zinc-blende CdSe andZnxCd1−xSe films grown on GaAs
5. High Precision Scanning Ellipsometer
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