Measurement of yield and spectrum of secondary electron emission and their characteristics under modification of conductive materials-Reference-Cited by-同舟云学术

Measurement of yield and spectrum of secondary electron emission and their characteristics under modification of conductive materials

Published:2019-06 Issue:6 Volume:90 Page:063304
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

He Jialong¹,Yang Jie¹,Peng Yufei¹,Long Jidong¹,Yang Zhen¹,Wang Tao¹,Liu Ping¹,Li Jie¹,Zheng Le¹,Dong Pan¹,Li Xi¹^ORCID,Lan Chaohui¹^ORCID,Zhao Wei¹,Liu Erxiang¹,Shi Jinshui¹^ORCID

Affiliation:

1. Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, People’s Republic of China

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5053965

Reference28 articles.

1. Head-Tail Instability Caused by Electron Clouds in Positron Storage Rings

2. Electron cloud in accelerators

3. Secondary electron emission studies

4. Overview of In-Orbit Radiation Induced Spacecraft Anomalies

5. Study of multipactor suppression of microwave components using perforated waveguide technology for space applications

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