Quantitative characterization of dielectric properties of nanoparticles using electrostatic force microscopy
Author:
Affiliation:
1. Department of Physics and Astronomy, Tufts University, 574 Boston Avenue, Medford, Massachusetts 02155, USA
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/5.0028132
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