Infrared light scattering tomography with an electrical streak camera for characterization of semiconductor crystals-Reference-Cited by-同舟云学术

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Infrared light scattering tomography with an electrical streak camera for characterization of semiconductor crystals

Published:1986-06 Issue:6 Volume:57 Page:1135-1139
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Ogawa Tomoya,Nango Nobuhito

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1138670

Reference2 articles.

1. Detection of plate-like defects by light-scattering tomography

2. Observation of Lattice Defects in GaAs and Heat-treated Si Crystals by Infrared Light Scattering Tomography

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