Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films byinsituvisible laser interferometry
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.112174
Reference14 articles.
1. Molecular beam epitaxy of semiconductor, dielectric and metal films
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3. Optical properties of AlxGa1−xAs
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5. Optical Investigation on the Growth Process of GaAs during Migration-Enhanced Epitaxy
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