Determination of refractive indices and thicknesses of Ba0.7Sr0.3TiO3 films with and without MgO (001) buffer layer on silicon substrate
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3232225
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1. Effects of post-annealing on the interface microstructure of (Ba,Sr)TiO3 thin films
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3. Morphology and dielectric properties of Ba0.5Sr0.5TiO3 thin films on annealed (100) MgO
4. Microwave dielectric properties and microstructure of Ba2−xSm4+2x/3Ti8+yO24+2y ceramics
5. Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants
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4. Growth and properties of highly orientated Sr0.75Ba0.25Nb2O6 thin films on silicon substrates with MgO or TiN buffer layers;Thin Solid Films;2011-07
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