Evolution of structural topology of forming nanocrystalline silicon film by atomic-scale-mechanism-driven model based on realistic network-Reference-Cited by-同舟云学术

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Evolution of structural topology of forming nanocrystalline silicon film by atomic-scale-mechanism-driven model based on realistic network

Published:2018-09 Issue:9 Volume:8 Page:095321
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Zhang Yixiong¹²,Wang Hong¹,Jiang Shaoji¹

Affiliation:

1. School of Physics, State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, Guangzhou 510275, People’s Republic of China

2. Department of Physics and Electrical Engineering, Hanshan Normal University, Chaozhou 521041, People’s Republic of China

Funder

the Special Program for Applied Research on Super Computation of the NSFC-Guangdong Joint Fund

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5048674

Reference40 articles.

1. Raman spectroscopy of B-doped microcrystalline silicon films

2. Effect of hydrogen dilution on the structure of amorphous silicon alloys

3. Midgap density of states in hydrogenated polymorphous silicon

4. Breakdown of thek-Conservation Rule in Si Nanocrystals

5. n-Type silicon quantum dots and p-type crystalline silicon heteroface solar cells

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