High temperature surface imaging using atomic force microscopy-Reference-Cited by-同舟云学术

High temperature surface imaging using atomic force microscopy

Published:2008-01-28 Issue:4 Volume:92 Page:043102
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Broekmaat Joska¹,Brinkman Alexander¹,Blank Dave H. A.¹,Rijnders Guus¹

Affiliation:

1. MESA+ Institute for Nanotechnology and Faculty of Science and Technology, University of Twente, 7500AE Enschede, The Netherlands

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Reference12 articles.

1. Atomic Force Microscope

2. In-situ elevated temperature imaging of thin films with a microfabricated hot stage for scanning probe microscopes

3. Temperature controlled microstage for an atomic force microscope

4. Construction and characterization of a heating stage for a scanning probe microscope up to 215 °C

5. D. A. Ivanov, R. Daniels, and S. N. Magonov, Exploring the High Temperature AFM and Its Use for Studies on Polymers (http://www.veeco.com/appnotes/AN45_HighTempHeater_090104_RevA1.pdf).

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