Polymorphism in CuInS2 epilayers: Origin of additional Raman modes-Reference-Cited by-同舟云学术

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Polymorphism in CuInS2 epilayers: Origin of additional Raman modes

Published:2002-01-28 Issue:4 Volume:80 Page:562-564
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

A̧lvarez-Garcı́a J.,Pérez-Rodrı́guez A.,Barcones B.,Romano-Rodrı́guez A.,Morante J. R.,Janotti A.,Wei Su-Huai,Scheer R.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1435800

Reference21 articles.

1. 9.2% efficient CuInS2 mini-module

2. Micro-Raman spectroscopy in polycrystalline CuInSe2 formation

3. Microstructure and secondary phases in coevaporated CuInS2 films: Dependence on growth temperature and chemical composition

4. Raman scattering structural evaluation of CuInS2 thin films

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