Thermally activated peroxy radical dissociation and annealing in vitreous SiO2
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.335800
Reference20 articles.
1. E′center in glassy SiO2:O17,H1, and "very weak"Si29superhyperfine structure
2. E′center in glassy SiO2:O17,H1, and "very weak"Si29superhyperfine structure
3. Characterization of three E'-center variants in X- and γ-irradiated high purity a-SiO2
4. Oxygen-associated trapped-hole centers in high-purity fused silicas
5. Fundamental defect centers in glass:Si29hyperfine structure of the nonbridging oxygen hole center and the peroxy radical ina-SiO2
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