Determination of Relative Intensity in X‐Ray Reflection Study
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1703011
Reference6 articles.
1. A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X‐Ray Spectrometer
2. Analysis of Certain Errors in the X‐Ray Reflection Method for the Quantitative Determination of Preferred Orientations
3. Preferred Orientation Determination Using a Geiger Counter X‐Ray Diffraction Goniometer
4. Determination of Preferred Orientation in Flat Transmission Samples Using a Geiger Counter X‐Ray Spectrometer
5. Eine neue Anordnung für röntgenkristallographische Untersuchungen von Kristallpulver
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4. Pole Figure and Orientation Distribution Function Analyses of FCC and BCC Metals;Advances in X-ray Analysis;1991
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