Scanning x‐ray fluorescent microanalysis of rock samples
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1140697
Reference2 articles.
1. New developments of X-ray fluorescence analysis with synchrotron radiation (SYXFA)
2. Review of X-ray fluorescent analysis using synchrotron radiation
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