Overestimation of the field-effect mobility via transconductance measurements and the origin of the output/transfer characteristic discrepancy in organic field-effect transistors-Reference-Cited by-同舟云学术

Overestimation of the field-effect mobility via transconductance measurements and the origin of the output/transfer characteristic discrepancy in organic field-effect transistors

Published:2009-01-15 Issue:2 Volume:105 Page:024506
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Reese Colin,Bao Zhenan

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3029587

Reference37 articles.

1. Organic Thin Film Transistors for Large Area Electronics

2. Organic thin film transistors

3. S. M. Sze, Semiconductor Devices, Physics and Technology, 2nd ed. (Wiley, New York, 2002), p. viii.

4. The Concept of “Threshold Voltage” in Organic Field-Effect Transistors

5. Intrinsic hole mobility and trapping in a regioregular poly(thiophene)

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