Design of mechanical components for vibration reduction in an atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3531948
Reference21 articles.
1. Atomic Resolution with Atomic Force Microscope
2. Electron beam and scanning probe lithography: A comparison
3. Near‐field magneto‐optics and high density data storage
4. Assessing the quality of scanning probe microscope designs
5. Analysis on vibration rejection ratio of scanning probe microscope
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4. Tilt Active Vibration Isolation Using Vertical Pendulum and Piezoelectric Transducer with Parallel Controller;Applied Sciences;2021-05-15
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