Terahertz dielectric response of photoexcited carriers in Si revealed via single-shot optical-pump and terahertz-probe spectroscopy
Author:
Affiliation:
1. Department of Physics, Graduate School of Engineering, Yokohama National University, Yokohama 240-8501, Japan
Funder
Strategic Information and Communications R&D Promotion Programme
Japan Society for the Promotion of Science (JSPS)
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4934697
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1. Corrigendum to “Photocarrier dynamics in thick Si film studied by optical pump-terahertz probe spectroscopy” [OPTICS 554C (2024) OPTICS_130139];Optics Communications;2024-05
2. Photocarrier dynamics in thick Si film studied by optical pump-terahertz probe spectroscopy;Optics Communications;2024-03
3. Single-pulse terahertz spectroscopy monitoring sub-millisecond time dynamics at a rate of 50 kHz;Nature Communications;2023-05-05
4. Singleshot and high-sensitivity detection of terahertz waveforms using phase-offset electro-optic sampling and an echelon mirror;Real-time Measurements, Rogue Phenomena, and Single-Shot Applications VIII;2023-03-14
5. Strong spectral broadening of Cherenkov-type terahertz radiation by free carrier generation;Physical Review A;2023-01-27
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